Atomic Scale Characterization and Measurement of Surface by Atomic Force Microscope
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEJ Transactions on Electronics, Information and Systems
سال: 1999
ISSN: 0385-4221,1348-8155
DOI: 10.1541/ieejeiss1987.119.10_1109